Two detectors are installed as standard. The combination of the standard automatic sample stage and IQ Mapping function allows multi area mapping and IR imaging of specific area with highest spectral Resolution.
Linear Array system with highest speed. Measurement in NIR and Mid IR region with optimized detectors.Dynamic imaging of samples with both conventional rapid scan and step-scan technologies IQ Mapping Full IR Imaging function Up to four objectives Wide are amapping and multi-ATR imaging Multivariate analysis PCA (Principal Component Analysis).
5309, Grain Market, Near B D Sen Sec School, Ambala Cantt, Haryana, 133001, India